Peter Ekberg — 10 Patents at Micron

Peter Ekberg has been granted 10 US patents while listed as an inventor at Micron. The first was granted in 2004 and the most recent in March 2011. Peter Ekberg ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Peter Ekberg in Lidingö, SE.

Patents per Year

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Showing 1–10 of 10 patents

Patent #	Title	Co-Inventors	Date
7912671	Method for measuring the position of a mark in a deflector system	Lars Stiblert	2011-03-22
7709165	Image enhancement for multiple exposure beams	—	2010-05-04
7488957	Pattern generation methods and apparatuses	John-Oskar Larsson	2009-02-10
7444616	Method for error reduction in lithography	Torbjorn Sandstrom	2008-10-28
7285365	Image enhancement for multiple exposure beams	—	2007-10-23
7148971	Apparatus for measuring the physical properties of a surface and a pattern generating apparatus for writing a pattern on a surface	Lars Stiblert	2006-12-12
6948254	Method for calibration of a metrology stage	Lars Stiblert	2005-09-27
6883158	Method for error reduction in lithography	Torbjorn Sandstrom, Per Askebjer, Mats Ekberg, Anders Thuren	2005-04-19
6844123	System for production of large area display panels with improved precision	Johan Åman	2005-01-18
6700600	Beam positioning in microlithography writing	Torbjorn Sandstrom, Leif Odselius, Stefan Gullstrand, Mattias Israelsson, Ingvar Andersson	2004-03-02

Peter Ekberg — 10 Patents

Patents per Year

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