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USPTO Patent Rankings Data through Dec 31, 2025
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Lars Stiblert — 13 Patents

Micron: 6 patents #2,235 of 6,374Top 40%
BIBiostar: 2 patents #9 of 30Top 30%
MAMycronic Ab: 1 patents #23 of 42Top 55%
Umeå, SE: #15 of 446 inventorsTop 4%
Overall (All Time): #362,438 of 4,157,543Top 9%
13 Patents All Time
Lars Stiblert has been granted 13 US patents while listed as an inventor at Micron. The first was granted in 1982 and the most recent in September 2014. Lars Stiblert ranks #362,438 of 4,157,543 US inventors in our database (top 8.7%). Patent records list Lars Stiblert in Umeå, SE.

Patents per Year

Patents granted per year, 1982 to 2014Bar chart with a peak of 2 patents in 1987.peak 21982: 1 patents19821985: 1 patents1987: 2 patents19871996: 1 patents1997: 1 patents19972005: 1 patents2006: 1 patents20062008: 1 patents2011: 1 patents20112012: 2 patents2014: 1 patents2014

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
8822879 Writing apparatuses and methods Torbjorn Sandstrom, Jarek Luberek, Tomas Lock 2014-09-02
8160351 Method and apparatus for mura detection and metrology Torbjorn Sandstrom 2012-04-17
8122846 Platforms, apparatuses, systems and methods for processing and analyzing substrates Torbjorn Sandstrom, Jarek Luberek, Tomas Lock 2012-02-28
7912671 Method for measuring the position of a mark in a deflector system Peter Ekberg 2011-03-22
7365829 Method and apparatus for image formation Måns Bjuggren, Lars Ivansen 2008-04-29
7148971 Apparatus for measuring the physical properties of a surface and a pattern generating apparatus for writing a pattern on a surface Peter Ekberg 2006-12-12
6948254 Method for calibration of a metrology stage Peter Ekberg 2005-09-27
5631171 Method and instrument for detection of change of thickness or refractive index for a thin film substrate Torbjorn Sandstrom, Diana M. Maul 1997-05-20
5494829 Devices and methods for detection of an analyte based upon light interference Torbjorn Sandstrom, Diana M. Maul 1996-02-27
4655595 Ellipsometric method and apparatus for studying physical properties of the surface of a testpiece Nils A. N. Bjork, Erland T. Sandstrom, Johan Stenberg 1987-04-07
4647207 Ellipsometric method and apparatus Nils A. N. Bjork, Erland T. Sandstrom, Johan Stenberg 1987-03-03
4558012 Method and member for detecting and/or measuring the concentration of a chemical substance B. Hakan Nygren, E. Torbjorn Sandstrom, Johan Stenberg 1985-12-10
4332476 Method and apparatus for studying surface properties Johan Stenberg, Erland T. Sandstrom 1982-06-01

Frequent Collaborators

Torbjorn Sandstrom5 shared
Johan Stenberg4 shared
Peter Ekberg3 shared
Erland T. Sandstrom3 shared
Jarek Luberek2 shared
Tomas Lock2 shared

Nearby-Ranked Inventors

Jianping Shen13
Eric John Telfeyan13
George R. Breiwa, III13
Thomas Sugar13
Andrew Howley13
Howard Halpern13
Po-Yuan Wang13
Douglas Vanesko13
Tanuj Trivedi13