Issued Patents All Time
Showing 51–66 of 66 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6195163 | Reflectance method for evaluating the surface characteristics of opaque materials | Randhir P. S. Thakur, J. Brett Rolfson, Robert Burke | 2001-02-27 |
| 6187628 | Semiconductor processing method of forming hemispherical grain polysilicon and a substrate having a hemispherical grain polysilicon layer | Randhir P. S. Thakur, John K. Zahurak, John P. Friedenreich | 2001-02-13 |
| 6165853 | Trench isolation method | Kevin J. Torek, David L. Chapek | 2000-12-26 |
| 6159852 | Method of depositing polysilicon, method of fabricating a field effect transistor, method of forming a contact to a substrate, method of forming a capacitor | Er-Xuan Ping, Yongjun Jeff Hu | 2000-12-12 |
| 6150706 | Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer | Randhir P. S. Thakur, Garry Mercaldi | 2000-11-21 |
| 6027984 | Method for growing oxide | Randhir P. S. Thakur, Pai-Hung Pan | 2000-02-22 |
| 6027990 | Using implants to lower anneal temperatures | Randhir P. S. Thakur | 2000-02-22 |
| 5976990 | Method for optimization of thin film deposition | Garry Mercaldi, Randhir P. S. Thankur | 1999-11-02 |
| 5969983 | Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer | Randhir P. S. Thakur, Garry Mercaldi | 1999-10-19 |
| 5899702 | Methods for measuring surface area | Kelly Hurley | 1999-05-04 |
| 5885896 | Using implants to lower anneal temperatures | Randhir P. S. Thakur | 1999-03-23 |
| 5831282 | Method of producing an HSG structure using an amorphous silicon disorder layer as a substrate | — | 1998-11-03 |
| 5825498 | Ultraviolet light reflectance method for evaluating the surface characteristics of opaque materials | Randhir P. S. Thakur, J. Brett Rolfson, Robert Burke | 1998-10-20 |
| 5712186 | Method for growing field oxide to minimize birds' beak length | Randhir P. S. Thakur, Pai-Hung Pan | 1998-01-27 |
| 5658381 | Method to form hemispherical grain (HSG) silicon by implant seeding followed by vacuum anneal | Randhir P. S. Thakur | 1997-08-19 |
| 5578505 | Methods for measuring the surface area of a semiconductor wafer | Kelly Hurley | 1996-11-26 |