Issued Patents All Time
Showing 26–38 of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6337634 | Radio frequency data communications device | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler Lowrey, George E. Pax +4 more | 2002-01-08 |
| 6316975 | Radio frequency data communications device | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler A. Lowery, George E. Pax +4 more | 2001-11-13 |
| 6314440 | Pseudo random number generator | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler Lowrey, George E. Pax +4 more | 2001-11-06 |
| 6278698 | Radio frequency data communications device | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler Lowrey, George E. Pax +4 more | 2001-08-21 |
| 6249185 | Method of speeding power-up of an amplifier, and amplifier | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler Lowrey, George E. Pax +4 more | 2001-06-19 |
| 6198357 | Stage having controlled variable resistance load circuit for use in voltage controlled ring oscillator | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler Lowrey, George E. Pax +4 more | 2001-03-06 |
| 6198332 | Frequency doubler and method of doubling frequency | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler Lowrey, George E. Pax +4 more | 2001-03-06 |
| 6157230 | Method for realizing an improved radio frequency detector for use in a radio frequency identification device, frequency lock loop, timing oscillator, method of constructing a frequency lock loop and method of operating an integrated circuit | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler Lowrey, George E. Pax +4 more | 2000-12-05 |
| 6130602 | Radio frequency data communications device | James E. O'Toole, John R. Tuttle, Mark E. Tuttle, Tyler Lowrey, George E. Pax +4 more | 2000-10-10 |
| 5933378 | Integrated circuit having forced substrate test mode with improved substrate isolation | Dean D. Gans | 1999-08-03 |
| 5461328 | Fixture for burn-in testing of semiconductor wafers | Mark Bunn, Brian P. Higgins | 1995-10-24 |
| 5391892 | Semiconductor wafers having test circuitry for individual dies | Mark Bunn, Brian P. Higgins | 1995-02-21 |
| 5279975 | Method of testing individual dies on semiconductor wafers prior to singulation | Mark Bunn, Brian P. Higgins | 1994-01-18 |