Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7274201 | Method and system for stressing semiconductor wafers during burn-in | Hani S. Attalla | 2007-09-25 |
| 5461328 | Fixture for burn-in testing of semiconductor wafers | Kevin M. Devereaux, Brian P. Higgins | 1995-10-24 |
| 5391892 | Semiconductor wafers having test circuitry for individual dies | Kevin M. Devereaux, Brian P. Higgins | 1995-02-21 |
| 5279975 | Method of testing individual dies on semiconductor wafers prior to singulation | Kevin M. Devereaux, Brian P. Higgins | 1994-01-18 |