Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9684760 | Measure of analysis performed in property checking | Jeremy Rutledge Levitt, Christophe Gauthron, Chian-min Richard Ho, Kalyana C. Mulam, Ramesh Sathianathan | 2017-06-20 |
| 9483594 | Reset verification | Ka Kei Kwok, Priya Viswanathan | 2016-11-01 |
| 9262557 | Measure of analysis performed in property checking | Jeremy Rutledge Levitt, Christophe Gauthron, Chian-min Richard Ho, Kalyana C. Mulam, Ramesh Sathianathan | 2016-02-16 |
| 8418121 | Measure of analysis performed in property checking | Jeremy Rutledge Levitt, Christophe Gauthron, Chian-min Richard Ho, Kalyana C. Mulam, Ramesh Sathianathan | 2013-04-09 |
| 7890897 | Measure of analysis performed in property checking | Jeremy Rutledge Levitt, Christophe Gauthron, Chian-min Richard Ho, Kalyana C. Mulam, Ramesh Sathianathan | 2011-02-15 |
| 7478028 | Method for automatically searching for functional defects in a description of a circuit | Chian-min Richard Ho, Robert Kristianto Mardjuki, David Lansing Dill, Jing Chyuarn Lin, Paul II Estrada +5 more | 2009-01-13 |
| 7454728 | Metastability injector for a circuit description | Tai A. Ly, Ka Kei Kwok, Vijaya Vardhan Gupta, Ross Andrew Andersen, Neil Hand +1 more | 2008-11-18 |
| 7454324 | Selection of initial states for formal verification | James Andrew Garrard Seawright, Ramesh Sathianathan, Christophe Gauthron, Jeremy Rutledge Levitt, Kalyana C. Mulam +1 more | 2008-11-18 |
| 7318205 | Measure of analysis performed in property checking | Jeremy Rutledge Levitt, Christophe Gauthron, Chian-min Richard Ho, Kalyana C. Mulam, Ramesh Sathianathan | 2008-01-08 |
| 7243322 | Metastability injector for a circuit description | Tai A. Ly, Ka Kei Kwok, Vijaya Vardhan Gupta, Ross Andrew Ander, Neil Hand +1 more | 2007-07-10 |
| 7007249 | Method for automatically generating checkers for finding functional defects in a description of circuit | Tai A. Ly, Jean-Charles Giomi, Kalyana C. Mulam, Paul Andrew Wilcox, David Lansing Dill +5 more | 2006-02-28 |
| 6885983 | Method for automatically searching for functional defects in a description of a circuit | Chian-min Richard Ho, Robert Kristianto Mardjuki, David Lansing Dill, Jing Chyuarn Lin, Paul Estrada +5 more | 2005-04-26 |
| 6848088 | Measure of analysis performed in property checking | Jeremy Rutledge Levitt, Christophe Gauthron, Chian-min Richard Ho, Kalyana C. Mulam, Ramesh Sathianathan | 2005-01-25 |
| 6609229 | Method for automatically generating checkers for finding functional defects in a description of a circuit | Tai A. Ly, Jean-Charles Giomi, Kalyana C. Mulam, Paul Andrew Wilcox, David Lansing Dill +5 more | 2003-08-19 |
| 6292765 | Method for automatically searching for functional defects in a description of a circuit | Chian-min Richard Ho, Robert Kristianto Mardjuki, David Lansing Dill, Jing Chyuarn Lin, Paul II Estrada +5 more | 2001-09-18 |
| 6175946 | Method for automatically generating checkers for finding functional defects in a description of a circuit | Tai A. Ly, Jean-Charles Giomi, Kalyana C. Mulam, Paul Andrew Wilcox, David Lansing Dill +5 more | 2001-01-16 |