Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6600557 | Method for the detection of processing-induced defects in a silicon wafer | Anca Stefanescu, Henry F. Erk, Tom Doane | 2003-07-29 |
| 6114245 | Method of processing semiconductor wafers | Roland R. Vandamme, Yun-Biao Xin | 2000-09-05 |