Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8498168 | Test method for screening local bit-line defects in a memory array | Yin Chin Huang, Chu Pang Huang, Yi Fang Chang, Cheng Chi Liu, Chang Chan Yang | 2013-07-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8498168 | Test method for screening local bit-line defects in a memory array | Yin Chin Huang, Chu Pang Huang, Yi Fang Chang, Cheng Chi Liu, Chang Chan Yang | 2013-07-30 |