Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8605525 | System and method for testing for defects in a semiconductor memory array | Yin Chin Huang, Chu Pang Huang, Min Li, Chang Chan Yang, Yi Fang Chang | 2013-12-10 |
| 8498168 | Test method for screening local bit-line defects in a memory array | Yin Chin Huang, Chu Pang Huang, Yi Fang Chang, Chang Chan Yang, Min Kuang Lee | 2013-07-30 |
| 7580302 | Parallel threshold voltage margin search for MLC memory application | Wen-Chiao Ho, Chin-Hung Chang, Kuen-Long Chang, Chun-Hsiung Hung | 2009-08-25 |