Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8605525 | System and method for testing for defects in a semiconductor memory array | Yin Chin Huang, Chu Pang Huang, Cheng Chi Liu, Min Li, Yi Fang Chang | 2013-12-10 |
| 8498168 | Test method for screening local bit-line defects in a memory array | Yin Chin Huang, Chu Pang Huang, Yi Fang Chang, Cheng Chi Liu, Min Kuang Lee | 2013-07-30 |