Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8605525 | System and method for testing for defects in a semiconductor memory array | Yin Chin Huang, Cheng Chi Liu, Min Li, Chang Chan Yang, Yi Fang Chang | 2013-12-10 |
| 8504883 | System and method for testing integrated circuits | Yin Chin Huang | 2013-08-06 |
| 8498168 | Test method for screening local bit-line defects in a memory array | Yin Chin Huang, Yi Fang Chang, Cheng Chi Liu, Chang Chan Yang, Min Kuang Lee | 2013-07-30 |
| 8351286 | Test method for screening manufacturing defects in a memory array | Yin Chin Huang | 2013-01-08 |