Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7968859 | Wafer edge defect inspection using captured image analysis | Roger Y. B. Young, Jason McNichols | 2011-06-28 |
| 7079966 | Method of qualifying a process tool with wafer defect maps | Deborah Leek, Nathan Strader | 2006-07-18 |
| 6512985 | Process control system | Bruce Whitefield, Manu Rehani | 2003-01-28 |