Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7079966 | Method of qualifying a process tool with wafer defect maps | John A. Knoch, Deborah Leek | 2006-07-18 |
| 7013222 | Wafer edge inspection data gathering | — | 2006-03-14 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7079966 | Method of qualifying a process tool with wafer defect maps | John A. Knoch, Deborah Leek | 2006-07-18 |
| 7013222 | Wafer edge inspection data gathering | — | 2006-03-14 |