Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11961576 | Method and apparatus for processing memory repair information | Benoit Nadeau-Dostie | 2024-04-16 |
| 6678875 | Self-contained embedded test design environment and environment setup utility | Brian John Pajak, Paul Price, Jean-Francois Cote | 2004-01-13 |
| 6615392 | Hierarchical design and test method and system, program product embodying the method and integrated circuit produced thereby | Benoit Nadeau-Dostie, Dwayne Burek, Jean-Francois Cote, Sonny Ngai San Shum, Pierre Girouard +3 more | 2003-09-02 |