RJ

Robert O. Hunter, Jr.

LI Litel Instruments: 56 patents #2 of 13Top 20%
IE Innoven Energy: 10 patents #1 of 7Top 15%
Overall (All Time): #27,825 of 4,157,543Top 1%
72
Patents All Time

Issued Patents All Time

Showing 25 most recent of 72 patents

Patent #TitleCo-InventorsDate
12136495 Simple and robust configuration for ICF targets Conner Daniel Cross Galloway, Alexander Vainius Valys, David H. Sowle 2024-11-05
11488729 Propellant grading for laser-driven multi-shell inertial confinement fusion target Eric W. Cornell 2022-11-01
11488728 Confinement walls for inertial confinement fusion chambers Eric W. Cornell 2022-11-01
11165216 Arrangement of expanding optical flows for efficient laser extraction Adlai H. Smith 2021-11-02
10862260 Integration of direct compressor with primary laser source and fast compressor 2020-12-08
10770860 Lookthrough compression arrangement 2020-09-08
10755820 Structure for containment of radiation from an ICF Conner Daniel Cross Galloway, Alexander Vainius Valys, David H. Sowle 2020-08-25
10475541 Simple and robust implosion of ICF targets Conner Daniel Cross Galloway, Alexander Vainius Valys, David H. Sowle 2019-11-12
10222178 Precision geographic location system and method utilizing an image product Adlai H. Smith 2019-03-05
10211588 Optical configurations for fusion laser 2019-02-19
10170883 Method for direct compression of laser pulses with large temporal ratios 2019-01-01
9903719 System and method for advanced navigation Adlai H. Smith 2018-02-27
9483816 Method and system for high accuracy and reliability registration of multi modal imagery Adlai H. Smith 2016-11-01
9287011 High-yield ICF containment chambers and power reactors David H. Sowle, Conner Daniel Cross Galloway, Alexander Vainius Valys 2016-03-15
9074848 Precision geographic location system and method utilizing an image product Adlai H. Smith 2015-07-07
8786827 Method and apparatus for measurement of exit pupil transmittance Adlai H. Smith 2014-07-22
7871004 Method and apparatus for self-referenced wafer stage positional error mapping Adlai H. Smith, Bruce McArthur 2011-01-18
7871002 Method and apparatus for self-referenced wafer stage positional error mapping Adlai H. Smith, Bruce McArthur 2011-01-18
7846624 Systems and methods for determination of focus and telecentricity, amelioration of metrology induced effects and application to determination of precision bossung curves Adlai H. Smith 2010-12-07
7697138 Method and apparatus for determination of source polarization matrix Adlai H. Smith 2010-04-13
7688426 Method and apparatus for measurement of exit pupil transmittance Adlai H. Smith 2010-03-30
7671979 Apparatus and process for determination of dynamic lens field curvature Adlai H. Smith 2010-03-02
7598006 Method and apparatus for embedded encoding of overlay data ordering in an in-situ interferometer Adlai H. Smith, Joseph J. Bendik 2009-10-06
7544449 Method and apparatus for measurement of crossfield chromatic response of projection imaging systems Adlai H. Smith, Joseph J. Bendik 2009-06-09
7515250 In-situ interferometer arrangement Adlai H. Smith 2009-04-07