BM

Bruce McArthur

LI Litel Instruments: 32 patents #3 of 13Top 25%
Overall (All Time): #103,857 of 4,157,543Top 3%
34
Patents All Time

Issued Patents All Time

Showing 25 most recent of 34 patents

Patent #TitleCo-InventorsDate
7871002 Method and apparatus for self-referenced wafer stage positional error mapping Adlai H. Smith, Robert O. Hunter, Jr. 2011-01-18
7871004 Method and apparatus for self-referenced wafer stage positional error mapping Adlai H. Smith, Robert O. Hunter, Jr. 2011-01-18
7337552 Method and apparatus for registration with integral alignment optics Adlai H. Smith, Robert O. Hunter, Jr., Thomas K. Khuu, Yuji Yamaguchi 2008-03-04
7271905 Method and apparatus for self-referenced wafer stage positional error mapping Adlai H. Smith, Robert O. Hunter, Jr. 2007-09-18
7268360 Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion Adlai H. Smith, Robert O. Hunter, Jr. 2007-09-11
7160657 Reference wafer and process for manufacturing same Adlai H. Smith, Robert O. Hunter, Jr. 2007-01-09
7136144 Method and apparatus for self-referenced dynamic step and scan intra-field lens distortion Adlai H. Smith, Robert O. Hunter, Jr. 2006-11-14
7099011 Method and apparatus for self-referenced projection lens distortion mapping Adlai H. Smith, Robert O. Hunter, Jr. 2006-08-29
7088427 Apparatus and method for high resolution in-situ illumination source measurement in projection imaging systems Adlai H. Smith, Robert O. Hunter, Jr. 2006-08-08
6899982 Method and apparatus for proper ordering of registration data Adlai H. Smith 2005-05-31
6833221 Method and apparatus for proper ordering of registration data Adlai H. Smith 2004-12-21
6741338 In-situ source metrology instrument and method of use Adlai H. Smith 2004-05-25
6734971 Method and apparatus for self-referenced wafer stage positional error mapping Adlai H. Smith, Robert O. Hunter, Jr. 2004-05-11
6699627 Reference wafer and process for manufacturing same Adlai H. Smith, Robert O. Hunter, Jr. 2004-03-02
6573986 Method and apparatus for self-referenced projection lens distortion mapping Adlai H. Smith, Robert O. Hunter, Jr. 2003-06-03
6356345 In-situ source metrology instrument and method of use Adlai H. Smith 2002-03-12
6208439 Generalized geometric transforms for computer generated holograms Adlai H. Smith 2001-03-27
6130009 Apparatus and process for nozzle production utilizing computer generated holograms Adlai H. Smith, Robert O. Hunter, Jr. 2000-10-10
5978085 Apparatus method of measurement and method of data analysis for correction of optical system Adlai H. Smith, Robert O. Hunter, Jr. 1999-11-02
5929991 Single plate corrector for stepper lens train Adlai H. Smith 1999-07-27
5828455 Apparatus, method of measurement, and method of data analysis for correction of optical system Adlai H. Smith, Robert O. Hunter, Jr. 1998-10-27
5702662 Process for ablating high density vias in flexible substrate Adlai H. Smith, Robert O. Hunter, Jr., Steven Blair, Jim Wilkinson 1997-12-30
5660738 Direct etch processes for the manufacture of high density modules Robert O. Hunter, Jr., Adlai H. Smith 1997-08-26
5640233 Plate correction technique for imaging systems Robert O. Hunter, Jr., Adlai H. Smith 1997-06-17
5633735 Use of fresnel zone plates for material processing Robert O. Hunter, Jr., Adlai H. Smith, Clark C. Guest 1997-05-27