Issued Patents All Time
Showing 25 most recent of 73 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11165216 | Arrangement of expanding optical flows for efficient laser extraction | Robert O. Hunter, Jr. | 2021-11-02 |
| 10222178 | Precision geographic location system and method utilizing an image product | Robert O. Hunter, Jr. | 2019-03-05 |
| 9903719 | System and method for advanced navigation | Robert O. Hunter, Jr. | 2018-02-27 |
| 9483816 | Method and system for high accuracy and reliability registration of multi modal imagery | Robert O. Hunter, Jr. | 2016-11-01 |
| 9074848 | Precision geographic location system and method utilizing an image product | Robert O. Hunter, Jr. | 2015-07-07 |
| 8786827 | Method and apparatus for measurement of exit pupil transmittance | Robert O. Hunter, Jr. | 2014-07-22 |
| 7871002 | Method and apparatus for self-referenced wafer stage positional error mapping | Robert O. Hunter, Jr., Bruce McArthur | 2011-01-18 |
| 7871004 | Method and apparatus for self-referenced wafer stage positional error mapping | Bruce McArthur, Robert O. Hunter, Jr. | 2011-01-18 |
| 7846624 | Systems and methods for determination of focus and telecentricity, amelioration of metrology induced effects and application to determination of precision bossung curves | Robert O. Hunter, Jr. | 2010-12-07 |
| 7697138 | Method and apparatus for determination of source polarization matrix | Robert O. Hunter, Jr. | 2010-04-13 |
| 7688426 | Method and apparatus for measurement of exit pupil transmittance | Robert O. Hunter, Jr. | 2010-03-30 |
| 7671979 | Apparatus and process for determination of dynamic lens field curvature | Robert O. Hunter, Jr. | 2010-03-02 |
| 7598006 | Method and apparatus for embedded encoding of overlay data ordering in an in-situ interferometer | Robert O. Hunter, Jr., Joseph J. Bendik | 2009-10-06 |
| 7544449 | Method and apparatus for measurement of crossfield chromatic response of projection imaging systems | Robert O. Hunter, Jr., Joseph J. Bendik | 2009-06-09 |
| 7515250 | In-situ interferometer arrangement | Robert O. Hunter, Jr. | 2009-04-07 |
| 7442951 | Reticle for use in rapid determination of average intrafield scanning distortion having transmissivity of a complementary alignment attribute being different than the transmissivity of at least one alignment attribute | — | 2008-10-28 |
| 7381503 | Reference wafer calibration reticle | Robert O. Hunter, Jr. | 2008-06-03 |
| 7337552 | Method and apparatus for registration with integral alignment optics | Robert O. Hunter, Jr., Bruce McArthur, Thomas K. Khuu, Yuji Yamaguchi | 2008-03-04 |
| 7295291 | Apparatus and process for the determination of static lens field curvature | Robert O. Hunter, Jr. | 2007-11-13 |
| 7286208 | In-situ interferometer arrangement | Robert O. Hunter, Jr. | 2007-10-23 |
| 7283202 | In-situ interferometer arrangement | Robert O. Hunter, Jr. | 2007-10-16 |
| 7271905 | Method and apparatus for self-referenced wafer stage positional error mapping | Bruce McArthur, Robert O. Hunter, Jr. | 2007-09-18 |
| 7268360 | Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion | Robert O. Hunter, Jr., Bruce McArthur | 2007-09-11 |
| 7262398 | Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion | — | 2007-08-28 |
| 7261985 | Process for determination of optimized exposure conditions for transverse distortion mapping | Joseph J. Bendik, Robert O. Hunter, Jr. | 2007-08-28 |