BC

Byung Jin Cho

KAIST: 13 patents #992 of 11,619Top 9%
HE Hynix (Hyundai Electronics): 12 patents #35 of 1,604Top 3%
SH Sk Hynix: 3 patents #1,930 of 4,849Top 40%
Lam Research: 2 patents #1,015 of 2,128Top 50%
CM Chartered Semiconductor Manufacturing: 2 patents #256 of 840Top 35%
KR Korea Institute Of Energy Research: 2 patents #260 of 702Top 40%
Samsung: 1 patents #49,284 of 75,807Top 70%
KM Korea Institute Of Machinery & Materials: 1 patents #283 of 729Top 40%
NS National University Of Singapore: 1 patents #498 of 1,623Top 35%
Overall (All Time): #115,773 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 1–25 of 31 patents

Patent #TitleCo-InventorsDate
12418280 Static change sense flip-flop Wanyeong Jung, Youngkeun Park, Kyounghun Kang 2025-09-16
12279413 Capacitor for dynamic random access memory, DRAM including the same and methods of fabricating thereof Hyunsoo Jin, Seongho Kim 2025-04-15
11984513 Charge trapping non-volatile organic memory device Min Ju Kim, Eui Joong Shin, Jae Joong Jung 2024-05-14
10615326 Flexible thermoelectric system Woochul Kim, Dong-Gyu Kim 2020-04-07
10535514 Method of sealing open pores on surface of porous dielectric material using iCVD process Sung Gap Im, Seong Jun Yoon, Kwanyong Pak, Hyungsuk Alexander Yoon 2020-01-14
10527494 Substrate on which multiple nanogaps are formed, and manufacturing method therefor Sung Gyu Park, Jung Heum Yun, Dong Ho Kim, Jung-Dae Kwon, Chae Won Mun 2020-01-07
10247685 High-temperature structure for measuring properties of curved thermoelectric device, and system and method for measuring properties of curved thermoelectric device using the same Sang Hyun Park, Chung-Yul Yoo, Hong-Soo Kim, Min-Soo Suh, Dong-Kook Kim 2019-04-02
10147864 Fe—Ni/Ti metalized skutterudite thermoelectric material and method of manufacturing the same Sang Hyun Park, Chung-Yul Yoo, Young Hwan Jin, Hana Yoon 2018-12-04
9472675 Method of manufacturing n-doped graphene and electrical component using NH4F, and graphene and electrical component thereby Jae Hoon Bong, Onejae Sul, Hyungsuk Alexander Yoon 2016-10-18
9450064 Semiconductor element, method for fabricating the same, and semiconductor device including the same Hyun Ahn, Jung-Min Moon 2016-09-20
9428829 Method for growing high-quality graphene layer Jeong Hun Mun 2016-08-30
9129811 Method and board for growing high-quality graphene layer using high pressure annealing Jeong Hun Mun 2015-09-08
8994079 Graphene electronic devices having multi-layered gate insulating layer Hyun-jae Song, Sun-ae Seo, Woo-Cheol Shin 2015-03-31
8638614 Non-volatile memory device and MOSFET using graphene gate electrode Jong Kyung Park 2014-01-28
8637851 Graphene device having physical gap Jeong Hun Mun 2014-01-28
7316950 Method of fabricating a CMOS device with dual metal gate electrodes Chang Seo Park, Narayanan Balasubramanian 2008-01-08
7112499 Dual step source/drain extension junction anneal to reduce the junction depth: multiple-pulse low energy laser anneal coupled with rapid thermal anneal Chyiu Hyia Poon, Leng Seow Tan, Alex See, Mousumi Bhat 2006-09-26
6897118 Method of multiple pulse laser annealing to activate ultra-shallow junctions Chyiu Hyia Poon, Yong Lu, Alex See, Mousumi Bhat 2005-05-24
RE37960 Method for forming an oxynitride film in a semiconductor device 2003-01-07
6153481 Method for forming an isolation insulating film for internal elements of a semiconductor device Se-Aug Jang, Chan Lim 2000-11-28
6027985 Method for forming element isolating film of semiconductor device Se-Aug Jang, Tae Sik Song, Young Bog Kim, Jong Choul Kim 2000-02-22
6013561 Method for forming field oxide film of semiconductor device Se-Aug Jang, Jong Choul Kim 2000-01-11
5985738 Method for forming field oxide of semiconductor device using wet and dry oxidation Se-Aug Jang, Young Bog Kim, Moon-Sig Joo, Jong Choul Kim 1999-11-16
5940719 Method for forming element isolating film of semiconductor device Se-Aug Jang, Tae Sik Song, Young Bog Kim, Jong Choul Kim 1999-08-17
5846887 Method for removing defects by ion implantation using medium temperature oxide layer Kil-Ho Lee 1998-12-08