Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11874102 | Thick photo resist layer metrology target | Lingyi Guo | 2024-01-16 |
| 11360398 | System and method for tilt calculation based on overlay metrology measurements | Roie Volkovich, Paul MacDonald, Ady Levy, Jinyan Song, Amnon Manassen | 2022-06-14 |