Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12418972 | Confocal chromatic metrology for EUV source condition monitoring | Patrick Tae, Ravichandra Jagannath, Brian Ahr | 2025-09-16 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12418972 | Confocal chromatic metrology for EUV source condition monitoring | Patrick Tae, Ravichandra Jagannath, Brian Ahr | 2025-09-16 |