Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347706 | Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein | Roie Volkovich, Renan Milo, Liran Yerushalmi, Yoel Feler, David Izraeli | 2025-07-01 |
| 11640117 | Selection of regions of interest for measurement of misregistration and amelioration thereof | Roie Volkovich | 2023-05-02 |
| 11302544 | Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein | Roie Volkovich, Renan Milo, Liran Yerushalmi, Yoel Feler, David Izraeli | 2022-04-12 |
| 10622238 | Overlay measurement using phase and amplitude modeling | Nadav Gutman, Eran Amit | 2020-04-14 |