Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11287248 | Method and system for optical three dimensional topography measurement | Guoheng Zhao, Maarten J. van der Burgt, Sheng Liu, Andy Hill, Karel Van Gils | 2022-03-29 |
| 10866092 | Chromatic confocal area sensor | Christophe Wouters, Kristof Joris | 2020-12-15 |
| 10634487 | Method and system for optical three dimensional topography measurement | Guoheng Zhao, Maarten J. van der Burgt, Sheng Liu, Andy Hill, Karel Van Gils | 2020-04-28 |
| 10215560 | Method for shape classification of an object | Laurent Hermans, Eric Delfosse, Frans Nijs, Francis Thissen | 2019-02-26 |
| 9886764 | Image acquisition system, image acquisition method, and inspection system | Guoheng Zhao, Stanley Stokowski, Andrew V. Hill, Maarten J. van der Burgt, Karel Van Gils | 2018-02-06 |
| 9255893 | Apparatus for illuminating substrates in order to image micro cracks, pinholes and inclusions in monocrystalline and polycrystalline substrates and method therefore | Wojciech Grzegorczyk, Kristiaan Van Rossen, Dominique Janssens | 2016-02-09 |
| 8830454 | Apparatus and methods for setting up optical inspection parameters | Benjamin Swerts | 2014-09-09 |