Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11340284 | Combined transmitted and reflected light imaging of internal cracks in semiconductor devices | Christophe Wouters | 2022-05-24 |
| 9255893 | Apparatus for illuminating substrates in order to image micro cracks, pinholes and inclusions in monocrystalline and polycrystalline substrates and method therefore | Wojciech Grzegorczyk, Johan De Greeve, Dominique Janssens | 2016-02-09 |