Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11287248 | Method and system for optical three dimensional topography measurement | Guoheng Zhao, Maarten J. van der Burgt, Sheng Liu, Andy Hill, Johan De Greeve | 2022-03-29 |
| 10634487 | Method and system for optical three dimensional topography measurement | Guoheng Zhao, Maarten J. van der Burgt, Sheng Liu, Andy Hill, Johan De Greeve | 2020-04-28 |
| 9886764 | Image acquisition system, image acquisition method, and inspection system | Guoheng Zhao, Stanley Stokowski, Andrew V. Hill, Johan De Greeve, Maarten J. van der Burgt | 2018-02-06 |
| 9776334 | Apparatus and method for automatic pitch conversion of pick and place heads, pick and place head and pick and place device | Bert Vangilbergen, Erik De Block, Jimmy Vermeulen, KW Cheung, KC Leung +2 more | 2017-10-03 |
| 9140546 | Apparatus and method for three dimensional inspection of wafer saw marks | Benoit Maison, Andy Hill, Laurent Hermans, Frans Nijs, Christophe Wouters | 2015-09-22 |
| 7423743 | Method and an apparatus for measuring positions of contact elements of an electronic component | Carl Smets, John Zabolitsky, Jurgen Everaerts | 2008-09-09 |
| 6778282 | Measuring positions of coplanarity of contract elements of an electronic component with a flat illumination and two cameras | Carl Smets, Maarten J. van der Burgt | 2004-08-17 |