Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8804106 | System and method for nondestructively measuring concentration and thickness of doped semiconductor layers | Nanchang Zhu, Derrick Shaughnessy, Houssam Chouaib, Yaolei Zheng, Lu Yu +2 more | 2014-08-12 |