Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11703460 | Methods and systems for optical surface defect material characterization | Zhiwei Xu, Kurt L. Haller, Christian Wolters | 2023-07-18 |
| 10670537 | Systems and methods for defect material classification | Guoheng Zhao, Michael D. Kirk | 2020-06-02 |
| 10234402 | Systems and methods for defect material classification | Guoheng Zhao, Michael D. Kirk | 2019-03-19 |