Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11441893 | Multi-spot analysis system with multiple optical probes | Prasanna Dighe, Dieter Mueller, Dong Chen, Steve Zamek, Daniel Kavaldjiev +1 more | 2022-09-13 |
| 10236222 | System and method for measuring substrate and film thickness distribution | Andrew Zeng | 2019-03-19 |
| 9651359 | Dual wavelength dual interferometer with combiner-splitter | Yi Zhang, Jie Zheng | 2017-05-16 |
| 7604360 | Integrated sensor for correlated color temperature and illuminance sensing | Chi Boon Ong, Chee Heng Wong | 2009-10-20 |