Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10359706 | Integrated scanning electron microscopy and optical analysis techniques for advanced process control | Hari Pathangi Sriraman, Sivaprrasath Meenakshisundaram | 2019-07-23 |
| 10204416 | Automatic deskew using design files or inspection images | Arpit Jain, Arpit Yati, Thirupurasundari Jayaraman, Raghavan Konuru, Raj Kuppa +2 more | 2019-02-12 |
| 9947596 | Range-based real-time scanning electron microscope non-visual binner | Hemanta Kumar Roy, Arpit Jain, Arpit Yati, Olivier Moreau | 2018-04-17 |