Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679333 | Defect detection, classification, and process window control using scanning electron microscope metrology | — | 2020-06-09 |
| 10551741 | Method of forming a directed self-assembled layer on a substrate | Werner Knaepen, Jan Willem Maes, Maarten Stokhof, Roel Gronheid | 2020-02-04 |
| 10359706 | Integrated scanning electron microscopy and optical analysis techniques for advanced process control | Sivaprrasath Meenakshisundaram, Arun Lobo | 2019-07-23 |
| 8338296 | Method for forming a catalyst suitable for growth of carbon nanotubes | Ann Witvrouw, Philippe M. Vereecken | 2012-12-25 |