Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8451440 | Apparatus for the optical inspection of wafers | Kurt Hahn, Roland Hedrich, Gerhard Hoppen, Lambert Danner, Albert Kreh +4 more | 2013-05-28 |
| 8087799 | Illumination means and inspection means having an illumination means | Kurt Hahn, Michael Hofmann | 2012-01-03 |