Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9927371 | Confocal line inspection optical system | Mark Wang, Andrey Kharisov | 2018-03-27 |
| 7705331 | Methods and systems for providing illumination of a specimen for a process performed on the specimen | Greg Kirk, Rich Solarz, Gil Delgado, Anatoly Schemelinin, Jim Li +2 more | 2010-04-27 |
| 5502306 | Electron beam inspection system and method | Dan Meisburger, Alan D. Brodie, Curt H. Chadwick, Anil Desai, Hans-Peter Dohse +28 more | 1996-03-26 |