Issued Patents All Time
Showing 26–50 of 53 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5369612 | Semiconductor memory device | — | 1994-11-29 |
| 5367481 | Dynamic random access memory with complementary bit lines and capacitor common line | Satoru Takase | 1994-11-22 |
| 5359566 | Dynamic random access memory | — | 1994-10-25 |
| 5343087 | Semiconductor device having a substrate bias generator | — | 1994-08-30 |
| 5343430 | Method and circuitry for screening a dynamic memory device for defective circuits | — | 1994-08-30 |
| 5341326 | Semiconductor memory having memory cell units each including cascade-connected MOS transistors | Satoru Takase, Natsuki Kushiyama | 1994-08-23 |
| 5317540 | Semiconductor memory device | — | 1994-05-31 |
| 5298433 | Method for testing semiconductor devices | — | 1994-03-29 |
| 5294776 | Method of burning in a semiconductor device | — | 1994-03-15 |
| 5287312 | Dynamic random access memory | Junichi Okamura | 1994-02-15 |
| 5276647 | Static random access memory including stress test circuitry | Masataka Matsui, Shigeyuki Hayakawa, Kiyofumi Ochii | 1994-01-04 |
| 5265057 | Semiconductor memory | Hiroyuki Noji | 1993-11-23 |
| 5258954 | Semiconductor memory including circuitry for driving plural word lines in a test mode | — | 1993-11-02 |
| 5148393 | MOS dynamic semiconductor memory cell | — | 1992-09-15 |
| 5138427 | Semiconductor device having a particular structure allowing for voltage stress test application | — | 1992-08-11 |
| 5043597 | Substrate bias generation circuit used in semiconductor integrated circuit | Hiroto Tanaka | 1991-08-27 |
| 5023476 | Semiconductor device with power supply mode-change controller for reliability testing | Yohji Watanabe | 1991-06-11 |
| 5014245 | Dynamic random access memory and method for writing data thereto | Kazuyoshi Muroka, Takashi Ohsawa | 1991-05-07 |
| 4967395 | Dram with (1/2)VCC precharge and selectively operable limiting circuit | Yohji Watanabe | 1990-10-30 |
| 4841483 | Semiconductor memory | — | 1989-06-20 |
| 4833341 | Semiconductor device with power supply voltage converter circuit | Yohji Watanabe | 1989-05-23 |
| 4733374 | Dynamic semiconductor memory device | Shigeyoshi Watanabe, Tatsuo Ikawa | 1988-03-22 |
| 4697252 | Dynamic type semiconductor memory device | Yukimasa Uchida | 1987-09-29 |
| 4686456 | Memory test circuit | Takashi Ohsawa | 1987-08-11 |
| 4569036 | Semiconductor dynamic memory device | Syuso Fujii, Shozo Saito, Kenji Natori | 1986-02-04 |