Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12046445 | Electron beam inspection apparatus and electron beam inspection method | — | 2024-07-23 |
| 7359043 | Pattern inspecting method and pattern inspecting apparatus | Hideo Tsuchiya, Yoshihide Kato, Kazuto Matsuki, Yasushi Sanada, Riki Ogawa | 2008-04-15 |