Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4990459 | Impurity measuring method | Ayako Maeda, Mokuji Kageyama, Masanobu Ogino | 1991-02-05 |
| 4980300 | Gettering method for a semiconductor wafer | Moriya Miyashita, Keiko SAKUMA | 1990-12-25 |
| 4837610 | Insulation film for a semiconductor device | Hachiro Hiratsuka, Yoshiaki Matsushita | 1989-06-06 |