KS

Koji Shibasaki

KT Kabushiki Kaisha Toshiba: 9 patents #3,402 of 21,451Top 20%
NU National University Corporation Kumamoto University: 1 patents #53 of 232Top 25%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
Overall (All Time): #423,107 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
8128731 Method for separating and enriching isotope material, multistage rotor, and apparatus for separating and enriching isotope material Tsutomu Mashimo, Masao Ono, Xinsheng Huang, Yusuke Iguchi, Satoru Okayasu +2 more 2012-03-06
6820503 High-speed rotation testing apparatus Masanori Sueyoshi, Akira Tezuka, Xinsheng Huang, Toyotaka Osakabe, Masao Ono +1 more 2004-11-23
6615670 High-speed rotation testing apparatus Takeshi Watabe, Shiro Shibasaki 2003-09-09
6111317 Flip-chip connection type semiconductor integrated circuit device Takashi Okada, Naohiko Hirano, Hiroshi Tazawa, Eiichi Hosomi, Chiaki Takubo +2 more 2000-08-29
6061466 Apparatus and method for inspecting an LSI device in an assembling process, capable of detecting connection failure of individual flexible leads Chiaki Takubo, Eiichi Hosomi, Hiroshi Tazawa 2000-05-09
6049130 Semiconductor device using gold bumps and copper leads as bonding elements Eiichi Hosomi, Hiroshi Tazawa, Chiaki Takubo 2000-04-11
5825081 Tape carrier and assembly structure thereof Eiichi Hosomi, Chiaki Takubo, Hiroshi Tazawa 1998-10-20
5801447 Flip chip mounting type semiconductor device Naohiko Hirano, Kazuhide Doi, Chiaki Takubo, Hiroshi Tazawa, Eiichi Hosomi +2 more 1998-09-01
5773888 Semiconductor device having a bump electrode connected to an inner lead Eiichi Hosomi, Chiaki Takubo, Hiroshi Tazawa 1998-06-30
5747881 Semiconductor device, method of fabricating the same and copper leads Eiichi Hosomi, Hiroshi Tazawa, Chiaki Takubo 1998-05-05
5631499 Semiconductor device comprising fine bump electrode having small side etch portion and stable characteristics Eiichi Hosomi, Chiaki Takubo, Hiroshi Tazawa, Ryouichi Miyamoto, Takashi Arai 1997-05-20
5615822 Method and apparatus for controlling bonding load of fine lead electrode Chiaki Takubo, Hiroshi Tazawa, Eiichi Hosomi 1997-04-01