Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11062894 | Mass spectrometer and mass spectrometry method | Reiko Saito, Tetsuo Sakamoto, Akio Takano | 2021-07-13 |
| 10916405 | Atom probe inspection device, field ion microscope, and distortion correction method | Takahiro Ikeda, Akira KURAMOTO | 2021-02-09 |
| 10553416 | Mass spectrometer performing mass spectrometry for sample with laser irradiation | Toma Yorisaki | 2020-02-04 |
| 10345336 | Scanning probe microscope and measurement method using the same | Jun Hirota, Tsukasa Nakai | 2019-07-09 |
| 9734985 | Analytical apparatus, sample holder and analytical method | Makiko Katano, Akira KURAMOTO | 2017-08-15 |
| 9431229 | Sputter neutral particle mass spectrometry apparatus with optical element | Toma Yorisaki, Reiko Saito | 2016-08-30 |
| 9287104 | Material inspection apparatus and material inspection method | — | 2016-03-15 |
| 8841614 | Sample structure analyzing method, transmission electron microscope, and computer-readable non-transitory recording medium | Takeshi Murakami | 2014-09-23 |
| 8748844 | Sample analyzing apparatus and sample analyzing method | — | 2014-06-10 |
| 7557040 | Method of manufacture of semiconductor device | Hiroshi Itokawa, Yoshimasa Kawase, Toshihiko Iinuma, Kyoichi Suguro | 2009-07-07 |
| 7495293 | Semiconductor device and method for manufacturing the same | Toshihiko Iinuma, Kyoichi Suguro | 2009-02-24 |
| 7145658 | Apparatus and method for evaluating semiconductor material | Katsumi Rikimaru, Kyoichi Suguro, Tatsuya Shima, Yoshimasa Kawase, Atsushi Murakoshi | 2006-12-05 |