Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11043369 | Sample analyzer and sample analysis method | Teruyuki Kinno | 2021-06-22 |
| 10916405 | Atom probe inspection device, field ion microscope, and distortion correction method | Takahiro Ikeda, Haruko Akutsu | 2021-02-09 |
| 10026743 | Semiconductor memory device and method for manufacturing same | Nobuhito KUGE, Tatsuya Fujishima, Masayuki Shishido, Hideto Onuma | 2018-07-17 |
| 9734985 | Analytical apparatus, sample holder and analytical method | Haruko Akutsu, Makiko Katano | 2017-08-15 |