Issued Patents All Time
Showing 1–25 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11709183 | Self flattening test socket with anti-bowing and elastomer retention | David Skodje, Michael Andres | 2023-07-25 |
| 11467183 | Integrated circuit contact test apparatus with and method of construction | Joel N. Erdman | 2022-10-11 |
| 11360117 | Waveguide integrated circuit testing | Cory Kostuchowski | 2022-06-14 |
| 11307232 | Waveguide integrated circuit testing | Cory Kostuchowski | 2022-04-19 |
| 11293968 | Integrated circuit testing for integrated circuits with antennas | — | 2022-04-05 |
| 11209458 | Integrated circuit contactor for testing ICs and method of construction | John E. Nelson, Ranauld Perez, Michael Andres, David A. Johnson | 2021-12-28 |
| 11183783 | High isolation contactor with test pin and housing for integrated circuit testing | Michael Andres | 2021-11-23 |
| 11002760 | High isolation housing for testing integrated circuits | Dennis J. Wagner | 2021-05-11 |
| 10928423 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Brian Halvorson +1 more | 2021-02-23 |
| 10877090 | Electrically conductive pins for microcircuit tester | John E. Nelson, Patrick J. Alladio, Russell F. Oberg, Brian Warwick, Gary W. Michalko | 2020-12-29 |
| 10794933 | Integrated circuit contact test apparatus with and method of construction | Joel N. Erdman | 2020-10-06 |
| 10761112 | Self flattening test socket with anti-bowing and elastomer retention | David Skodje, Mike Andres | 2020-09-01 |
| 10725069 | Integrated circuit contactor for testing ICs and method of construction | John E. Nelson, Ranauld Perez, Michael Andres, David A. Johnson | 2020-07-28 |
| 10698000 | Waveguide integrated testing | Cory Kostuchowski | 2020-06-30 |
| 10686269 | High isolation contactor with test pin and housing for integrated circuit testing | Michael Andres | 2020-06-16 |
| 10302675 | Electrically conductive pins microcircuit tester | John E. Nelson, Brian Warwick, Gary W. Michalko | 2019-05-28 |
| 10274515 | Waveguide integrated testing | Cory Kostuchowski | 2019-04-30 |
| 10247755 | Electrically conductive kelvin contacts for microcircuit tester | Joel N. Erdman, Gary W. Michalko | 2019-04-02 |
| 10073117 | Resilient interposer with electrically conductive slide-by pins as part of a microcircuit tester | John E. Nelson, Brian Warwick, Gary W. Michalko | 2018-09-11 |
| 10067164 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Brian Halvorson +1 more | 2018-09-04 |
| 9696347 | Testing apparatus and method for microcircuit and wafer level IC testing | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Brian Halvorson +1 more | 2017-07-04 |
| 9678106 | Electrically conductive pins for microcircuit tester | John E. Nelson, Brian Warwick, Gary W. Michalko | 2017-06-13 |
| 9606143 | Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing | — | 2017-03-28 |
| 9500673 | Electrically conductive kelvin contacts for microcircuit tester | Joel N. Erdman, Gary W. Michalko | 2016-11-22 |
| 9476936 | Thermal management for microcircuit testing system | David A. Johnson, Harlan Faller, Brian Warwick, Sarosh Patel, John Richard Bucher +1 more | 2016-10-25 |