JD

John DeBauche

JI Johnstech International: 3 patents #23 of 53Top 45%
Overall (All Time): #1,428,603 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10928423 Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings Dan Campion, Michael Andres, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more 2021-02-23
10067164 Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings Dan Campion, Michael Andres, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more 2018-09-04
9696347 Testing apparatus and method for microcircuit and wafer level IC testing Dan Campion, Michael Andres, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more 2017-07-04