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Self flattening test socket with anti-bowing and elastomer retention |
David Skodje, Jeffrey C. Sherry |
2023-07-25 |
| 11209458 |
Integrated circuit contactor for testing ICs and method of construction |
John E. Nelson, Ranauld Perez, Jeffrey C. Sherry, David A. Johnson |
2021-12-28 |
| 11183783 |
High isolation contactor with test pin and housing for integrated circuit testing |
Jeffrey C. Sherry |
2021-11-23 |
| 11029335 |
Selectively geometric shaped contact pin for electronic component testing and method of fabrication |
David A. Johnson, Neil Anthony Graf, Kenna Pretts |
2021-06-08 |
| 10928423 |
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings |
John DeBauche, Dan Campion, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more |
2021-02-23 |
| 10725069 |
Integrated circuit contactor for testing ICs and method of construction |
John E. Nelson, Ranauld Perez, Jeffrey C. Sherry, David A. Johnson |
2020-07-28 |
| 10686269 |
High isolation contactor with test pin and housing for integrated circuit testing |
Jeffrey C. Sherry |
2020-06-16 |
| 10551412 |
Low resistance low wear test pin for test contactor |
— |
2020-02-04 |
| 10401386 |
On-center electrically conductive pins for integrated testing |
David A. Johnson, John E. Nelson, Sarosh Patel |
2019-09-03 |
| 10114039 |
Selectively geometric shaped contact pin for electronic component testing and method of fabrication |
David A. Johnson, Neil Anthony Graf, Kenna Pretts |
2018-10-30 |
| 10067164 |
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings |
John DeBauche, Dan Campion, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more |
2018-09-04 |
| 9804194 |
Low resistance low wear test pin for test contactor |
— |
2017-10-31 |
| 9696347 |
Testing apparatus and method for microcircuit and wafer level IC testing |
John DeBauche, Dan Campion, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more |
2017-07-04 |
| 9638714 |
On-center electrically conductive pins for integrated testing |
David A. Johnson, John E. Nelson, Sarosh Patel |
2017-05-02 |
| 9429591 |
On-center electrically conductive pins for integrated testing |
David A. Johnson, John E. Nelson, Sarosh Patel |
2016-08-30 |
| 9341649 |
On-center electrically conductive pins for integrated testing |
David A. Johnson, John E. Nelson, Sarosh Patel |
2016-05-17 |
| 9274141 |
Low resistance low wear test pin for test contactor |
— |
2016-03-01 |
| D719923 |
Articulating contact pin |
David A. Johnson, Sarosh Patel, John E. Nelson |
2014-12-23 |