Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11709183 | Self flattening test socket with anti-bowing and elastomer retention | David Skodje, Jeffrey C. Sherry | 2023-07-25 |
| 11209458 | Integrated circuit contactor for testing ICs and method of construction | John E. Nelson, Ranauld Perez, Jeffrey C. Sherry, David A. Johnson | 2021-12-28 |
| 11183783 | High isolation contactor with test pin and housing for integrated circuit testing | Jeffrey C. Sherry | 2021-11-23 |
| 11029335 | Selectively geometric shaped contact pin for electronic component testing and method of fabrication | David A. Johnson, Neil Anthony Graf, Kenna Pretts | 2021-06-08 |
| 10928423 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Dan Campion, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more | 2021-02-23 |
| 10725069 | Integrated circuit contactor for testing ICs and method of construction | John E. Nelson, Ranauld Perez, Jeffrey C. Sherry, David A. Johnson | 2020-07-28 |
| 10686269 | High isolation contactor with test pin and housing for integrated circuit testing | Jeffrey C. Sherry | 2020-06-16 |
| 10551412 | Low resistance low wear test pin for test contactor | — | 2020-02-04 |
| 10401386 | On-center electrically conductive pins for integrated testing | David A. Johnson, John E. Nelson, Sarosh Patel | 2019-09-03 |
| 10114039 | Selectively geometric shaped contact pin for electronic component testing and method of fabrication | David A. Johnson, Neil Anthony Graf, Kenna Pretts | 2018-10-30 |
| 10067164 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Dan Campion, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more | 2018-09-04 |
| 9804194 | Low resistance low wear test pin for test contactor | — | 2017-10-31 |
| 9696347 | Testing apparatus and method for microcircuit and wafer level IC testing | John DeBauche, Dan Campion, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more | 2017-07-04 |
| 9638714 | On-center electrically conductive pins for integrated testing | David A. Johnson, John E. Nelson, Sarosh Patel | 2017-05-02 |
| 9429591 | On-center electrically conductive pins for integrated testing | David A. Johnson, John E. Nelson, Sarosh Patel | 2016-08-30 |
| 9341649 | On-center electrically conductive pins for integrated testing | David A. Johnson, John E. Nelson, Sarosh Patel | 2016-05-17 |
| 9274141 | Low resistance low wear test pin for test contactor | — | 2016-03-01 |
| D719923 | Articulating contact pin | David A. Johnson, Sarosh Patel, John E. Nelson | 2014-12-23 |