Issued Patents All Time
Showing 26–36 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9329204 | Electrically conductive Kelvin contacts for microcircuit tester | Joel N. Erdman, Gary W. Michalko | 2016-05-03 |
| 9297832 | Electrically conductive pins for microcircuit tester | John E. Nelson, Brian Warwick, Gary W. Michalko | 2016-03-29 |
| 9007082 | Electrically conductive pins for microcircuit tester | John E. Nelson, Patrick J. Alladio, Russell F. Oberg, Brian Warwick, Gary W. Michalko | 2015-04-14 |
| 8988090 | Electrically conductive kelvin contacts for microcircuit tester | Joel N. Erdman, Gary W. Michalko | 2015-03-24 |
| 8937484 | Microcircuit tester with slideable electrically conductive pins | John E. Nelson, Patrick J. Alladio, Russell F. Oberg, Brian Warwick, Gary W. Michalko | 2015-01-20 |
| 8912811 | Test contact system for testing integrated circuits with packages having an array of signal and power contacts | Patrick J. Alladio, Russell F. Oberg, Brian Warwick | 2014-12-16 |
| 8558554 | Electrically conductive Kelvin contacts for microcircuit tester | Joel N. Erdman, Gary W. Michalko | 2013-10-15 |
| 8536889 | Electrically conductive pins for microcircuit tester | John E. Nelson, Patrick J. Alladio, Russell F. Oberg, Brian Warwick, Gary W. Michalko | 2013-09-17 |
| 8354854 | Microcircuit testing interface having kelvin and signal contacts within a single slot | — | 2013-01-15 |
| 8102184 | Test contact system for testing integrated circuits with packages having an array of signal and power contacts | Patrick J. Alladio, Russell F. Oberg, Brian Warwick | 2012-01-24 |
| 7737708 | Contact for use in testing integrated circuits | — | 2010-06-15 |