Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6953939 | Testing apparatus using scanning electron microscope | Tetsuo Abe, Kouki Okawauchi, Tadashi Hattori, Hironori Fujita, Minoru Takeda +4 more | 2005-10-11 |
| 6831278 | System and method for electron beam irradiation | Masanobu Yamamoto, Hiroshi Kawase, Jun Sasaki, Minoru Takeda, Gakuo Komatsubara +2 more | 2004-12-14 |
| 6737660 | Electron beam irradiation apparatus and electron beam irradiating method | Yoshihisa Miura, Yuichi Aki, Hiroshi Kawase, Masanobu Yamamoto, Setsuo Norioka +2 more | 2004-05-18 |
| 6734437 | System and method for electron beam irradiation | Setsuo Norioka, Toshiaki Miyokawa, Jun Sasaki, Yuichi Aki, Yoshihisa Miura | 2004-05-11 |
| 6021295 | Developing apparatus | Eiji Ochiai, Shigeki Tsukahara, Makoto Hamaguchi | 2000-02-01 |
| 4439681 | Charged particle beam scanning device | Setsuo Norioka | 1984-03-27 |
| 4431915 | Electron beam apparatus | Seiichi Nakagawa, Yoshio Ishimori | 1984-02-14 |