Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11973629 | Non-disruptive phased array calibration for FDD and TDD communication systems | Gregg S. Nardozza, Giovanni Marzin, Robert C. Frye, Mihai Banu | 2024-04-30 |
| 11962273 | Precision high frequency phase adders | Mihai Banu | 2024-04-16 |
| 11819047 | Cam roller type horizontal extrusion cracking system for walnuts | Changhe Li, Mingzheng Liu, Yucheng Wang, Yanbin Zhang, Ji CHE +10 more | 2023-11-21 |
| 11771126 | Multi-station adaptive walnut shell pre-breaking system | Changhe Li, Mingcun Shi, Yitian Feng, Zhenming Jia, Leilei Zhao +8 more | 2023-10-03 |
| 10992305 | Initialization method for precision phase adder | Giovanni Marzin | 2021-04-27 |
| 10917048 | Precision high frequency phase adders | Mihai Banu | 2021-02-09 |
| 10693417 | Precision high frequency phase adders | Mihai Banu | 2020-06-23 |
| 10574432 | Active array calibration | Mihai Banu | 2020-02-25 |
| 10225067 | Active array calibration | Mihai Banu | 2019-03-05 |
| 9728836 | Electronic device including main body, movable portion and connector | Jun Ma, Shuangqi Cen | 2017-08-08 |
| 9485770 | Techniques for achieving high average spectrum efficiency in a wireless system | Mihai Banu, David M. Poticny | 2016-11-01 |
| 9161360 | Techniques for achieving high average spectrum efficiency in a wireless system | Mihai Banu, David M. Poticny | 2015-10-13 |
| 9154244 | Systems and methods for controlling the second order intercept point of receivers | Peter R. Kinget | 2015-10-06 |
| 8849227 | Systems and methods for controlling the second order intercept point of receivers | Peter R. Kinget | 2014-09-30 |
| 8611959 | Low cost, active antenna arrays | Mihai Banu, Vladimir Prodanov | 2013-12-17 |
| 8004290 | Method and apparatus for determining dielectric layer properties | Xiafang Zhang, Nanchang Zhu, Min Xiang, Jianou Shi | 2011-08-23 |
| 7893703 | Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer | Jeffrey Rzepiela, Shiyou Pei, Alexander Kagan, Jianou Shi, Sergio Edelstein | 2011-02-22 |
| 7525304 | Measurement of effective capacitance | Jianou Shi, Xiafang Zhang | 2009-04-28 |