MY

Munehiro Yoshida

KT Kabushiki Kaisha Toshiba: 16 patents #1,863 of 21,451Top 9%
IBM: 6 patents #16,453 of 70,183Top 25%
Mitsubishi Electric: 2 patents #11,187 of 25,717Top 45%
MC Mitsubishi Electric Semiconductor Software Co.: 2 patents #11 of 117Top 10%
SO Sony: 1 patents #17,262 of 25,231Top 70%
PM Powerchip Semiconductor Manufacturing: 1 patents #85 of 193Top 45%
TC Toshiba America Electronic Components: 1 patents #23 of 77Top 30%
IH Ihi: 1 patents #624 of 1,178Top 55%
📍 Yokohama, NY: #33 of 63 inventorsTop 55%
Overall (All Time): #182,822 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
11475963 Semiconductor memory with data protection function and data protection method thereof 2022-10-18
11078830 Multi-stage turbocharger Kiyomichi Ichikawa, Yoshimitsu Matsuyama 2021-08-03
7789558 Thermal sensing circuit using bandgap voltage reference generators without trimming circuitry David William Boerstler 2010-09-07
7535020 Systems and methods for thermal sensing Daniel Stasiak, Michael Fan Wang, Charles Ray Johns, Hiroki Kihara, Tetsuji Tamura +2 more 2009-05-19
7524108 Thermal sensing circuits using bandgap voltage reference generators without trimming circuitry David William Boerstler 2009-04-28
7427158 Advanced thermal sensor 2008-09-23
7187053 Thermal sensing method and system David William Boerstler 2007-03-06
7102417 Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit Melia F. Gordon, Charles Ray Johns, Hiroki Kihara, Iwao Takiguchi, Tetsuji Tamura +2 more 2006-09-05
7079432 Semiconductor storage device formed to optimize test technique and redundancy technology Daisuke Kato, Takashi Taira, Kenji Ishizuka, Yohji Watanabe 2006-07-18
6957378 Semiconductor memory device Mitsuhiro Koga, Hiroshi Shinya 2005-10-18
6876588 Semiconductor storage device formed to optimize test technique and redundancy technology Daisuke Kato, Takashi Taira, Kenji Ishizuka, Yohji Watanabe 2005-04-05
6856561 Semiconductor memory device Daisuke Kato, Yohji Watanabe 2005-02-15
6646932 Semiconductor memory device having redundancy system Daisuke Kato, Yohji Watanabe 2003-11-11
6570801 Semiconductor memory having refresh function Hiroshi Shinya 2003-05-27
6356507 Synchronous DRAM using column operation sychronous pulses which are different between read and write Mariko Kaku 2002-03-12
6301144 Semiconductor memory device Yohji Watanabe 2001-10-09
6063131 Emulator system and emulation method 2000-05-16
6016265 Fuse-latch circuit having high integration density Ryouji Kotani 2000-01-18
5964876 Program-invocation-count measuring system, program-invocation-count measuring method, and medium for storing program-invocation-count measuring software Eisuke Shimomura 1999-10-12
5561630 Data sense circuit for dynamic random access memories Daisuke Katoh, Toshiaki Kirihata 1996-10-01
5367487 Semiconductor memory device 1994-11-22
5231607 Semiconductor memory device Syuso Fujii 1993-07-27
5110750 Semiconductor device and method of making the same 1992-05-05