Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416663 | Embedded system to characterize BTI degradation effects in MOSFETs | Michele Quarantelli, Tomasz Brozek, Christopher Hess, Larg Weiland, Sharad Saxena | 2025-09-16 |