Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8502979 | Methods and systems for determining a critical dimension and overlay of a specimen | Ady Levy, Kyle Brown, Rodney Smedt, Gary Bultman, Mehrdad Nikoonahad +2 more | 2013-08-06 |
| 8179530 | Methods and systems for determining a critical dimension and overlay of a specimen | Ady Levy, Kyle Brown, Rodney Smedt, Gary Bultman, Mehrdad Nikoonahad +2 more | 2012-05-15 |