ZN

Zvi Nirel

NI Nova Measuring Instruments: 8 patents #15 of 108Top 15%
Overall (All Time): #572,533 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9291911 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Yoel Cohen 2016-03-22
8780320 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Yoel Cohen 2014-07-15
8482715 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Yoel Cohen 2013-07-09
7821614 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Yoel Cohen 2010-10-26
7525634 Monitoring apparatus and method particularly useful in photolithographically Giora Dishon, Moshe Finarov, Yoel Cohen 2009-04-28
7289190 Monitoring apparatus and method particularly useful in photolithographically Giora Dishon, Moshe Finarov, Yoel Cohen 2007-10-30
7030957 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Yoel Cohen 2006-04-18
6842220 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Yoel Cohen 2005-01-11
6166801 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Yoel Cohen 2000-12-26