Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8198105 | Monitor for variation of critical dimensions (CDs) of reticles | Hyesook Hong, John K. Wright | 2012-06-12 |
| 6593033 | Attenuated rim phase shift mask | Anthony Yen, Cesar M. Garza | 2003-07-15 |