Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12210338 | Computer system of observation device and processing method | Kosuke Matsumoto, Satoshi Takada, Hideki Nakayama, Miyuki Fukuda, Kozo Miyake | 2025-01-28 |
| 10770260 | Defect observation device | Yuko Otani, Yohei Minekawa, Takashi Nobuhara, Nobuhiko KANZAKI, Takehiro Hirai +3 more | 2020-09-08 |
| 8892494 | Device for classifying defects and method for adjusting classification | Makoto Ono, Yohei Minekawa, Junko Konishi, Takehiro Hirai | 2014-11-18 |
| 8625906 | Image classification standard update method, program, and image classification device | Fumiaki Endo, Tomohiro Funakoshi, Junko Konishi, Tsunehiro Sakai | 2014-01-07 |