Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12198061 | Method and apparatus for predicting yield of semiconductor devices | Shanshan Chen, Hunglin Chen | 2025-01-14 |
| 11687488 | Directory deletion method and apparatus, and storage server | Shengqian Jia | 2023-06-27 |
| 11344719 | Electric bandage for accelerated wound recovery | Xudong Wang, Weibo Cai, Hao Wei | 2022-05-31 |
| 11307151 | Method for detecting wafer backside defect | Zengyi Yuan, Kai-Hsiang Wang | 2022-04-19 |
| 9269639 | Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor device | Rongwei Fan, Feijue Liu, Qiliang Ni, Hunglin Chen | 2016-02-23 |
| 9080863 | Method for monitoring alignment between contact holes and polycrystalline silicon gate | Qiliang Ni, Hunglin Chen, Zhounan Wang, Mingsheng Guo | 2015-07-14 |
| 8987013 | Method of inspecting misalignment of polysilicon gate | Rongwei Fan, Hunglin Chen, Qiliang Ni | 2015-03-24 |
| 8865482 | Method of detecting the circular uniformity of the semiconductor circular contact holes | Kai-Hsiang Wang, Hunglin Chen, Qiliang Ni, MingShen Kuo | 2014-10-21 |
| 8658438 | Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devices | Rongwei Fan, Qiliang Ni, Kai-Hsiang Wang, Hunglin Chen | 2014-02-25 |